# Demystifying Mixed Signal Test Methods

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Mai 2003

## Beschreibung

### Beschreibung

Mixed Signal Test Methods Demystified is a less theoretical, less mathematical, and more applications-oriented approach than other books available on the topic. In effect, this book will give readers a just in time understanding of the essentials of mixed signal testing techniques. Emphasis will be on commonly used devices and systems (such as PLLs and DSP) that engineers encounter in their daily tasks. Sampling theory is covered in detail, as this is the foundation for understanding all mixed signal testing technique, and readers will have a strong intuitive grasp of this topic after finishing this book. Baker aims to develop an intuitive understanding of mixed signal testing that minimizes the mathematics required and is germane to the sort of testing requirements found in typical engineering situations. *Takes a less theoretical, less mathematical, and more applications-oriented approach*Emphasizes commonly used devices and systems that engineers encounter in their daily tasks*Aims to develop an intuitive understanding of mixed signal testing### Inhaltsverzeichnis

Introduction; Mixed Signal Measurements and Parameters; Sampling Theory for Signal Generation; Sampling Theory for Signal Acquisition; Frequency Domain Analysis and the FFT; DSP Based Testing; DAC Test Applications; ADC Test Applications; Test Circuit Design Considerations; Mixed Signal Test Application - Codec Testing### Portrait

Mark Baker has been a test engineer for such companies as Spectra-Physics, Zilog, Pragmatic Test Systems, Schlumberger, Teradyne, and EPRO. In 1997, he founded his own company, TechniCom, which was devoted to technical training courses and seminars; one of their courses was on mixed-signal testing. In the fall of 2001, TechniCom was acquired by Texas Instruments and Baker is now a technical training manager for TI. Baker has published numerous in-house application articles for the ATE companies Teradyne and Schlumberger as well as articles in Electronics Test and Evaluation Engineering magazines.EAN: 9780750676168

ISBN: 0750676167

Untertitel: New.
Sprache: Englisch.

Verlag: NEWNES

Erscheinungsdatum: Mai 2003

Seitenanzahl: 279 Seiten

Format: gebunden

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