EBOOK

High Performance Memory Testing


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September 2002

Beschreibung

Beschreibung

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Inhaltsverzeichnis

Preface. Section
I: Design & Test of Memories.
1. Opening Pandora's Box.
2. Static Random Access Memories.
3. Multi-Port Memories.
4. Silicon On Insulator Memories.
5. Content Addressable Memories.
6. Dynamic Random Access Memories.
7. Non-Volatile Memories. Testing
II: Memory Testing.
8. Memory Faults.
9. Memory Patterns. Section
III: Memory Self Test.
10. BIST Concepts.
11. State Machine BIST.
12. Micro-Code BIST.
13. BIST and Redundancy.
14. Design For Test and BIST.
15. Conclusions. Appendices. Appendix A. Further Memory Fault Modeling. Appendix B. Further Memory Test Patterns. Appendix C. State Machine HDL. References. Glossary/Acronyms. Index. About the Author.

Pressestimmen

From the reviews:
"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)
EAN: 9781402072550
ISBN: 1402072554
Untertitel: Design Principles, Fault Modeling and Self-Test. 'Frontiers in Electronic Testing'. 2003. Auflage. Book. Sprache: Englisch.
Verlag: Springer
Erscheinungsdatum: September 2002
Seitenanzahl: 266 Seiten
Format: gebunden
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