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System-On-Chip Test Architectures: Nanometer Design for Testability

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November 2007

Beschreibung

Beschreibung

Written by a stellar team of field experts, this title is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that allow VSLI designers, DFT practitioners, and students to master quickly System-on-Chip Test architectures, memory, and analog/mixed-signal designs.

Inhaltsverzeichnis

Introduction; Digital Test Architectures; Fault-Tolerant Design; SOC/NOC Test Architectures; SIP Test Architectures; Delay Testing; Low-Power Testing; Coping with Physical Failures, Soft Errors, and Reliability Issues; Design for Manufacturability and Yield; Design for Debug and Diagnosis; Software-Based Self-Testing; FPGA Testing; MEMS Testing; High-Speed I/O Interface; Analog and Mixed-Signal Test Architectures; RF Testing; Testing Aspects of Nanotechnology Trends.



Portrait

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).
EAN: 9780123739735
ISBN: 012373973X
Untertitel: Sprache: Englisch.
Verlag: MORGAN KAUFMANN PUBL INC
Erscheinungsdatum: November 2007
Seitenanzahl: 856 Seiten
Format: gebunden
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